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Information card for entry 4515420
Preview
Coordinates | 4515420.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C64 H29 B F20 Ir N5 |
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Calculated formula | C64 H29 B F20 Ir N5 |
SMILES | [Ir]123([n]4ccccc4c4ccccc24)([n]2ccccc2c2ccccc32)[n]2ccccc2c2[n]1c1ccccc1n2c1ccccc1.Fc1c(c(F)c(F)c(F)c1F)[B-](c1c(F)c(F)c(F)c(F)c1F)(c1c(F)c(F)c(F)c(F)c1F)c1c(F)c(F)c(F)c(F)c1F |
Title of publication | Controlling Ion Distribution for High-Performance Organic Light-Emitting Diodes Based on Sublimable Cationic Iridium(III) Complexes. |
Authors of publication | Ma, Dongxin; Zhang, Chen; Liu, Ruihuan; Qiu, Yong; Duan, Lian |
Journal of publication | ACS applied materials & interfaces |
Year of publication | 2018 |
Journal volume | 10 |
Journal issue | 35 |
Pages of publication | 29814 - 29823 |
a | 19.05 ± 0.004 Å |
b | 19.381 ± 0.004 Å |
c | 30.191 ± 0.006 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 11147 ± 4 Å3 |
Cell temperature | 153 ± 2 K |
Ambient diffraction temperature | 153.15 K |
Number of distinct elements | 6 |
Space group number | 61 |
Hermann-Mauguin space group symbol | P b c a |
Hall space group symbol | -P 2ac 2ab |
Residual factor for all reflections | 0.1972 |
Residual factor for significantly intense reflections | 0.1862 |
Weighted residual factors for significantly intense reflections | 0.3867 |
Weighted residual factors for all reflections included in the refinement | 0.4029 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.272 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4515420.html
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Users of the data should acknowledge the original authors of the
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