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Information card for entry 4516412
Preview
Coordinates | 4516412.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C64 H296 Cu20 In32 N64 S78 |
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Calculated formula | C54 Cu20 In32 N36 S78 |
SMILES | C(CN)[NH3+].C(CN)[NH3+].C(CN)[NH3+].[NH3+]CCN.S1[In]2(S[In]34[S]5[Cu]67S89[Cu]%10%11[S]4[In]4(S2)[S]2[In]15S[In]15S[In]%12(=S)S[In]%13([S]61)S[In]16S[In]%14(=S)S[In](S3)([S]71)[S]%11[In]1(S%14)[S]6[Cu]39[S]%13[In]6(S%12)[S]5[Cu]82[S]2[In]5(S4)[S]%10[In]4(S1)[S]3[In]2(S6)[S][In]([S]5)(=S)S4)=S.[Cu]12345[Cu]6789[S]1[Cu]1%1039[Cu]39%11%12[Cu]%13%14%157[S]6[Cu]678%13[Cu]8%13%16%17[S]6[Cu]627%13[Cu]274([Cu]4%13%16([Cu]9%158([S]3%14)[S]%174)[Cu]1%112([S]%10%12)[S]7%13)[S]56.C(CN)[NH3+].C(CN)[NH3+].C(CN)[NH3+].C(CN)[NH3+].C(CN)[NH3+].C(CN)[NH3+].C(CN)[NH3+].C(CN)[NH3+].C(CN)[NH3+].C(CN)[NH3+].C(CN)[NH3+].C(CN)[NH3+].C(CN)[NH3+].C(CN)[NH3+].C(CN)[NH3+].C(CN)[NH3+].C(CN)[NH3+].C(CN)[NH3+].C(CN)[NH3+].C(CN)[NH3+].S=[In]12S[In]34[S]5[Cu]67[S]8[In]9%10S[In]%11(=S)S[In]8(S3)[S]3[Cu]8%12[S]4[In]4(S2)[S]2[Cu]%13%14[S]%15[In]%16(S[In]%17(=S)S[In]([S]6%16)(S9)[S]6[Cu]9([S]%10[In]3(S%11)S[In]3%10[S]%12[In]%11(S4)[S]%14[In](S[In]%156S%17)([S]93)S[In](S%11)(S%10)=S)S78%13)S[In]52S1 |
Title of publication | Co-assembled T4-Cu4In16S35 and Cubic Cu12S8 Clusters: A Crystal Precursor for Near-Infrared Absorption Material |
Authors of publication | Zhao, Xiao-Wei; Qian, Li-Wen; Su, Hu-Chao; Mo, Chong-Jiao; Que, Chen-Jie; Zhu, Qin-Yu; Dai, Jie |
Journal of publication | Crystal Growth & Design |
Year of publication | 2015 |
Journal volume | 15 |
Journal issue | 12 |
Pages of publication | 5749 |
a | 20.0486 ± 0.0004 Å |
b | 20.0486 ± 0.0004 Å |
c | 71.773 ± 0.0017 Å |
α | 90° |
β | 90° |
γ | 120° |
Cell volume | 24983.9 ± 0.9 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 6 |
Space group number | 148 |
Hermann-Mauguin space group symbol | R -3 :H |
Hall space group symbol | -R 3 |
Residual factor for all reflections | 0.1148 |
Residual factor for significantly intense reflections | 0.0751 |
Weighted residual factors for significantly intense reflections | 0.1604 |
Weighted residual factors for all reflections included in the refinement | 0.1754 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.091 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4516412.html
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