Information card for entry 4516597
| Formula |
C30 H28 N6 O2 S2 |
| Calculated formula |
C30 H28 N6 O2 S2 |
| SMILES |
C1(=O)C(=C(C#N)C#N)c2c(cc(s2)c2cc3c(C(=C(C#N)C#N)C(=O)N3CCCCCC)s2)N1CCCCCC |
| Title of publication |
n-Type Organic Field-Effect Transistors Based on Bisthienoisatin Derivatives |
| Authors of publication |
Yoo, Dongho; Luo, Xuyi; Hasegawa, Tsukasa; Ashizawa, Minoru; Kawamoto, Tadashi; Masunaga, Hiroyasu; Ohta, Noboru; Matsumoto, Hidetoshi; Mei, Jianguo; Mori, Takehiko |
| Journal of publication |
ACS Applied Electronic Materials |
| Year of publication |
2019 |
| Journal volume |
1 |
| Journal issue |
5 |
| Pages of publication |
764 |
| a |
9.2227 ± 0.0003 Å |
| b |
5.1146 ± 0.0002 Å |
| c |
29.4199 ± 0.0012 Å |
| α |
90° |
| β |
99.1713 ± 0.0018° |
| γ |
90° |
| Cell volume |
1370.01 ± 0.09 Å3 |
| Cell temperature |
171 K |
| Ambient diffraction temperature |
171 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.2606 |
| Residual factor for significantly intense reflections |
0.0947 |
| Weighted residual factors for significantly intense reflections |
0.1501 |
| Weighted residual factors for all reflections included in the refinement |
0.2128 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.892 |
| Diffraction radiation wavelength |
1.54187 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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