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Information card for entry 4516625
Preview
Coordinates | 4516625.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C41 H42 Cl2 F6 Ir N4 P |
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Calculated formula | C41 H42 Cl2 F6 Ir N4 P |
SMILES | [Ir]123([n]4c(cccc4)c4c2cccc4)([n]2c(cccc2)c2c3cccc2)[n]2c(cc(cc2)C(C)(C)C)c2[n]1ccc(c2)C(C)(C)C.ClCCl.[P](F)(F)(F)(F)(F)[F-] |
Title of publication | Chiral Iridium(III) Complexes in Light-Emitting Electrochemical Cells: Exploring the Impact of Stereochemistry on the Photophysical Properties and Device Performances. |
Authors of publication | Martir, Diego Rota; Momblona, Cristina; Pertegás, Antonio; Cordes, David B.; Slawin, Alexandra M. Z.; Bolink, Henk J.; Zysman-Colman, Eli |
Journal of publication | ACS applied materials & interfaces |
Year of publication | 2016 |
Journal volume | 8 |
Journal issue | 49 |
Pages of publication | 33907 - 33915 |
a | 13.3394 ± 0.001 Å |
b | 13.8004 ± 0.0012 Å |
c | 21.779 ± 0.0018 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 4009.3 ± 0.6 Å3 |
Cell temperature | 173 K |
Ambient diffraction temperature | 173 K |
Number of distinct elements | 7 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.0287 |
Residual factor for significantly intense reflections | 0.0267 |
Weighted residual factors for significantly intense reflections | 0.0669 |
Weighted residual factors for all reflections included in the refinement | 0.0801 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.109 |
Diffraction radiation wavelength | 0.71075 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4516625.html
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