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Information card for entry 4516816
Preview
Coordinates | 4516816.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C11 H8 Br N O |
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Calculated formula | C11 H8 Br N O |
SMILES | Brc1cc2c(cc1)cc(cc2)C(=O)N |
Title of publication | Thiolate versus Selenolate: Structure, Stability, and Charge Transfer Properties. |
Authors of publication | Ossowski, Jakub; Wächter, Tobias; Silies, Laura; Kind, Martin; Noworolska, Agnieszka; Blobner, Florian; Gnatek, Dominika; Rysz, Jakub; Bolte, Michael; Feulner, Peter; Terfort, Andreas; Cyganik, Piotr; Zharnikov, Michael |
Journal of publication | ACS nano |
Year of publication | 2015 |
Journal volume | 9 |
Journal issue | 4 |
Pages of publication | 4508 - 4526 |
a | 18.518 ± 0.0016 Å |
b | 6.151 ± 0.0003 Å |
c | 8.6436 ± 0.0008 Å |
α | 90° |
β | 90.291 ± 0.007° |
γ | 90° |
Cell volume | 984.53 ± 0.13 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0496 |
Residual factor for significantly intense reflections | 0.0476 |
Weighted residual factors for significantly intense reflections | 0.1221 |
Weighted residual factors for all reflections included in the refinement | 0.1253 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.047 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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