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Information card for entry 4516952
Preview
Coordinates | 4516952.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C47 H45 F6 N O P2 Ru |
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Calculated formula | C47 H45 F6 N O P2 Ru |
SMILES | [Ru]123456(Oc7c8ccccc8ccc7C=[N]5[C@H](c5ccccc5)C)([P](c5ccccc5)(c5ccccc5)c5ccccc5)[c]5([cH]1[cH]2[c]3([cH]6[cH]45)C(C)C)C.[P](F)(F)(F)(F)(F)[F-] |
Title of publication | PPh<sub>3</sub> Propeller Diastereomers: Bonding Motif Ph<sub>PPh<sub>3</sub></sub> Face-On π-Ar in Half-Sandwich Compounds [(π-Ar)LL'MPPh<sub>3</sub>]. |
Authors of publication | Brunner, Henri; Balázs, Gábor; Tsuno, Takashi; Iwabe, Haruka |
Journal of publication | ACS omega |
Year of publication | 2018 |
Journal volume | 3 |
Journal issue | 1 |
Pages of publication | 982 - 990 |
a | 10.5006 ± 0.0001 Å |
b | 17.8634 ± 0.0001 Å |
c | 34.4468 ± 0.0001 Å |
α | 90° |
β | 98.1 ± 0.001° |
γ | 90° |
Cell volume | 6396.95 ± 0.07 Å3 |
Cell temperature | 110 ± 0.02 K |
Ambient diffraction temperature | 110 ± 0.1 K |
Number of distinct elements | 7 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.0427 |
Residual factor for significantly intense reflections | 0.0414 |
Weighted residual factors for significantly intense reflections | 0.1086 |
Weighted residual factors for all reflections included in the refinement | 0.11 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.012 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4516952.html
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Users of the data should acknowledge the original authors of the
structural data.