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Information card for entry 4517218
Preview
Coordinates | 4517218.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C20 H40 O4 S Si4 |
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Calculated formula | C20 H40 O4 S Si4 |
SMILES | S(=O)(=O)(c1ccc(C(C[Si]([Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)C)C(=O)OC)cc1)C |
Title of publication | Arylsilylation of Electron-Deficient Alkenes via Cooperative Photoredox and Nickel Catalysis |
Authors of publication | Zhang, Zhikun; Hu, Xile |
Journal of publication | ACS Catalysis |
Year of publication | 2019 |
Journal volume | 10 |
Journal issue | 1 |
Pages of publication | 777 |
a | 22.0893 ± 0.0004 Å |
b | 9.47947 ± 0.00015 Å |
c | 14.2315 ± 0.0003 Å |
α | 90° |
β | 107.915 ± 0.002° |
γ | 90° |
Cell volume | 2835.51 ± 0.1 Å3 |
Cell temperature | 140 ± 0.1 K |
Ambient diffraction temperature | 140 ± 0.1 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0428 |
Residual factor for significantly intense reflections | 0.0414 |
Weighted residual factors for significantly intense reflections | 0.1124 |
Weighted residual factors for all reflections included in the refinement | 0.1139 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.047 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4517218.html
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