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Information card for entry 4517420
Preview
Coordinates | 4517420.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C26 H14 F4 S2 |
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Calculated formula | C26 H14 F4 S2 |
SMILES | s1c(ccc1c1ccccc1)c1c(F)c(F)c(c(F)c1F)c1sc(cc1)c1ccccc1 |
Title of publication | Fluorinated Thiophene-Phenylene Co-Oligomers for Optoelectronic Devices. |
Authors of publication | Sosorev, Andrey Yu; Trukhanov, Vasiliy A.; Maslennikov, Dmitry R.; Borshchev, Oleg V.; Polyakov, Roman A.; Skorotetcky, Maxim S.; Surin, Nikolay M.; Kazantsev, Maxim S.; Dominskiy, Dmitry I.; Tafeenko, Viktor A.; Ponomarenko, Sergey A.; Paraschuk, Dmitry Yu |
Journal of publication | ACS applied materials & interfaces |
Year of publication | 2020 |
Journal volume | 12 |
Journal issue | 8 |
Pages of publication | 9507 - 9519 |
a | 43.582 ± 0.001 Å |
b | 5.8661 ± 0.0001 Å |
c | 7.7244 ± 0.0002 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 1974.79 ± 0.08 Å3 |
Cell temperature | 295 ± 2 K |
Ambient diffraction temperature | 295 K |
Number of distinct elements | 4 |
Space group number | 29 |
Hermann-Mauguin space group symbol | P c a 21 |
Hall space group symbol | P 2c -2ac |
Residual factor for all reflections | 0.0439 |
Residual factor for significantly intense reflections | 0.0369 |
Weighted residual factors for significantly intense reflections | 0.0894 |
Weighted residual factors for all reflections included in the refinement | 0.0916 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.934 |
Diffraction radiation wavelength | 1.54186 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4517420.html
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