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Information card for entry 4518950
Preview
| Coordinates | 4518950.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C18 H10 Ni2 O15 |
|---|---|
| Calculated formula | C18 H10 Ni2 O15 |
| Title of publication | <i>In Situ</i> Aliovalent Nickle Substitution and Acidic Modification of Nanowalls Promoted Proton Conductivity in InOF with 1D Helical Channel. |
| Authors of publication | Gao, Hui; He, Yan-Bin; Hou, Juan-Juan; Zhang, Xian-Ming |
| Journal of publication | ACS applied materials & interfaces |
| Year of publication | 2021 |
| Journal volume | 13 |
| Journal issue | 32 |
| Pages of publication | 38289 - 38295 |
| a | 15.1751 ± 0.0003 Å |
| b | 15.1751 ± 0.0003 Å |
| c | 12.0768 ± 0.0004 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2781.09 ± 0.12 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100.15 K |
| Number of distinct elements | 4 |
| Space group number | 98 |
| Hermann-Mauguin space group symbol | I 41 2 2 |
| Hall space group symbol | I 4bw 2bw |
| Residual factor for all reflections | 0.0619 |
| Residual factor for significantly intense reflections | 0.0575 |
| Weighted residual factors for significantly intense reflections | 0.1656 |
| Weighted residual factors for all reflections included in the refinement | 0.1711 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.195 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4518950.html
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Users of the data should acknowledge the original authors of the
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