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Information card for entry 4519039
Preview
| Coordinates | 4519039.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C81 H72 Cl4 N2 O5 P2 |
|---|---|
| Calculated formula | C81 H72 Cl4 N2 O5 P2 |
| Title of publication | Spiro-Based Thermally Activated Delayed Fluorescence Emitters with Reduced Nonradiative Decay for High-Quantum-Efficiency, Low-Roll-Off, Organic Light-Emitting Diodes. |
| Authors of publication | Sharma, Nidhi; Maciejczyk, Michal; Hall, David; Li, Wenbo; Liégeois, Vincent; Beljonne, David; Olivier, Yoann; Robertson, Neil; Samuel, Ifor D. W.; Zysman-Colman, Eli |
| Journal of publication | ACS applied materials & interfaces |
| Year of publication | 2021 |
| Journal volume | 13 |
| Journal issue | 37 |
| Pages of publication | 44628 - 44640 |
| a | 32.3093 ± 0.0008 Å |
| b | 8.91065 ± 0.00019 Å |
| c | 24.5282 ± 0.0006 Å |
| α | 90° |
| β | 98.619 ± 0.002° |
| γ | 90° |
| Cell volume | 6981.8 ± 0.3 Å3 |
| Cell temperature | 120 K |
| Ambient diffraction temperature | 120 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0709 |
| Residual factor for significantly intense reflections | 0.0556 |
| Weighted residual factors for significantly intense reflections | 0.1283 |
| Weighted residual factors for all reflections included in the refinement | 0.1362 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.06 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4519039.html
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Users of the data should acknowledge the original authors of the
structural data.