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Information card for entry 4519088
Preview
| Coordinates | 4519088.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H24 N2 |
|---|---|
| Calculated formula | C32 H24 N2 |
| SMILES | c1ccc(cc1)/N=N/c1ccc(cc1)C(=C(c1ccccc1)c1ccccc1)c1ccccc1 |
| Title of publication | Embedding Azobenzol-Decorated Tetraphenylethylene into the Polymer Matrix to Implement a Ternary Memory Device with High Working Temperature/Humidity. |
| Authors of publication | Zhou, Pan-Ke; Zong, Lu-Lu; Song, Kai-Yue; Yang, Zhen-Cong; Li, Hao-Hong; Chen, Zhi-Rong |
| Journal of publication | ACS applied materials & interfaces |
| Year of publication | 2021 |
| Journal volume | 13 |
| Journal issue | 42 |
| Pages of publication | 50350 - 50357 |
| a | 54.739 ± 0.009 Å |
| b | 5.6219 ± 0.0008 Å |
| c | 36.439 ± 0.006 Å |
| α | 90° |
| β | 121.647 ± 0.004° |
| γ | 90° |
| Cell volume | 9546 ± 3 Å3 |
| Cell temperature | 150 K |
| Ambient diffraction temperature | 150 K |
| Number of distinct elements | 3 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.2348 |
| Residual factor for significantly intense reflections | 0.1272 |
| Weighted residual factors for significantly intense reflections | 0.3101 |
| Weighted residual factors for all reflections included in the refinement | 0.3748 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.056 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4519088.html
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Users of the data should acknowledge the original authors of the
structural data.