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Information card for entry 4519200
Preview
| Coordinates | 4519200.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H48 Ag Br8 In N4 |
|---|---|
| Calculated formula | C32 H48 Ag Br8 In N4 |
| SMILES | [In](Br)(Br)(Br)([Br][Ag](Br)Br)(Br)Br.[NH3+]CCc1ccccc1.[NH3+]CCc1ccccc1.[NH3+]CCc1ccccc1.[NH3+]CCc1ccccc1 |
| Title of publication | Decreasing Structural Dimensionality of Double Perovskites for Phase Stabilization toward Efficient X-ray Detection. |
| Authors of publication | Chen, Da; Niu, Guangda; Hao, Shiqiang; Fan, Liubing; Zhao, Jing; Wolverton, Christopher; Xia, Mengling; Liu, Quanlin |
| Journal of publication | ACS applied materials & interfaces |
| Year of publication | 2021 |
| Journal volume | 13 |
| Journal issue | 51 |
| Pages of publication | 61447 - 61453 |
| a | 11.34511 ± 0.0001 Å |
| b | 11.51794 ± 0.00011 Å |
| c | 17.21017 ± 0.00017 Å |
| α | 107.002 ± 0.0009° |
| β | 100.938 ± 0.0008° |
| γ | 90.5325 ± 0.0007° |
| Cell volume | 2106.5 ± 0.04 Å3 |
| Cell temperature | 99.99 ± 0.1 K |
| Ambient diffraction temperature | 99.99 ± 0.1 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0346 |
| Residual factor for significantly intense reflections | 0.0334 |
| Weighted residual factors for significantly intense reflections | 0.0975 |
| Weighted residual factors for all reflections included in the refinement | 0.0987 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.056 |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4519200.html
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Users of the data should acknowledge the original authors of the
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