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Information card for entry 5000376
Preview
Coordinates | 5000376.cif |
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Original paper (by DOI) | HTML |
Formula | C57 H59 B F25 O P2 Ru |
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Calculated formula | C57 H59 B F25 O P2 Ru |
Title of publication | The First η^2^-CH~2~Cl~2~ Adduct of Ru(II):[RuH(η^2^-CH~2~Cl~2~)(CO)(P^t^Bu~2~Me)~2~][BAr'~4~] (Ar' = 3,5-C~6~H~3~(CF~3~)~2~) and Its RuH(CO)(P^t^Bu~2~Me)~2~ + Precursor |
Authors of publication | Huang, Dejian; Huffman, John C.; Bollinger, John C.; Eisenstein, Odile; Caulton, Kenneth G. |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 1997 |
Journal volume | 119 |
Journal issue | 31 |
Pages of publication | 7398 - 7399 |
a | 18.744 ± 0.003 Å |
b | 17.87 ± 0.003 Å |
c | 18.608 ± 0.003 Å |
α | 90° |
β | 95.48 ± 0.01° |
γ | 90° |
Cell volume | 6204.4 ± 1.7 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 7 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.1632 |
Residual factor for significantly intense reflections | 0.0789 |
Weighted residual factors for all reflections | 0.155 |
Weighted residual factors for significantly intense reflections | 0.13 |
Goodness-of-fit parameter for all reflections | 1.264 |
Goodness-of-fit parameter for significantly intense reflections | 1.533 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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The link is: https://www.crystallography.net/5000376.html
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