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Information card for entry 5000376
Preview
| Coordinates | 5000376.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C57 H59 B F25 O P2 Ru |
|---|---|
| Calculated formula | C57 H59 B F25 O P2 Ru |
| Title of publication | The First η^2^-CH~2~Cl~2~ Adduct of Ru(II):[RuH(η^2^-CH~2~Cl~2~)(CO)(P^t^Bu~2~Me)~2~][BAr'~4~] (Ar' = 3,5-C~6~H~3~(CF~3~)~2~) and Its RuH(CO)(P^t^Bu~2~Me)~2~ + Precursor |
| Authors of publication | Huang, Dejian; Huffman, John C.; Bollinger, John C.; Eisenstein, Odile; Caulton, Kenneth G. |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 1997 |
| Journal volume | 119 |
| Journal issue | 31 |
| Pages of publication | 7398 - 7399 |
| a | 18.744 ± 0.003 Å |
| b | 17.87 ± 0.003 Å |
| c | 18.608 ± 0.003 Å |
| α | 90° |
| β | 95.48 ± 0.01° |
| γ | 90° |
| Cell volume | 6204.4 ± 1.7 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.1632 |
| Residual factor for significantly intense reflections | 0.0789 |
| Weighted residual factors for all reflections | 0.155 |
| Weighted residual factors for significantly intense reflections | 0.13 |
| Goodness-of-fit parameter for all reflections | 1.264 |
| Goodness-of-fit parameter for significantly intense reflections | 1.533 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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