Information card for entry 7000236

Structure parameters

• Formula: C55 H64 P4 Pt
• Calculated formula: C55 H64 P4 Pt
• SMILES: [Pt]1(P(=P1)(C(C)C)C(C)C)([P](c1ccc(cc1)C)(c1ccc(cc1)C)c1ccc(cc1)C)[P](c1ccc(cc1)C)(c1ccc(cc1)C)c1ccc(cc1)C.c1ccccc1C
• Title of publication: Reactions of R2P‒P(SiMe3)Li with [(R′3P)2PtCl2]. A general and efficient entry to phosphanylphosphinidene complexes of platinum. Syntheses and structures of [(η2-PPiPr2)Pt(p-Tol3P)2], [(η2-PPtBu2)Pt(p-Tol3P)2], [{η2-PP(NiPr2)2}Pt(p-Tol3P)2] and [{(Et2PhP)2Pt}2P2]
• Authors of publication: Domańska-Babul, Wioleta; Chojnacki, Jaroslaw; Matern, Eberhard; Pikies, Jerzy
• Journal of publication: Dalton Transactions
• Year of publication: 2009
• Journal issue: 1
• Pages of publication: 146 - 151
• a: 13.2476 ± 0.0005 Å
• b: 13.3322 ± 0.0005 Å
• c: 15.2573 ± 0.0006 Å
• α: 74.503 ± 0.003°
• β: 77.636 ± 0.003°
• γ: 75.331 ± 0.004°
• Cell volume: 2480.93 ± 0.17 ų
• Cell temperature: 120 ± 2 K
• Ambient diffraction temperature: 120 ± 2 K
• Number of distinct elements: 4
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0528
• Residual factor for significantly intense reflections: 0.0376
• Weighted residual factors for significantly intense reflections: 0.0924
• Weighted residual factors for all reflections included in the refinement: 0.104
• Goodness-of-fit parameter for all reflections included in the refinement: 1.042
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No