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Information card for entry 7000240
Preview
Coordinates | 7000240.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C36 H76 Hf O16 Si8 |
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Calculated formula | C36 H76 Hf O16 Si8 |
SMILES | C1(=[O][Hf]234(OC(=CC(=[O]2)O[Si](C)(C)C)O[Si](C)(C)C)(OC(=C1)O[Si](C)(C)C)(OC(=CC(=[O]3)O[Si](C)(C)C)O[Si](C)(C)C)[O]=C(C=C(O[Si](C)(C)C)O4)O[Si](C)(C)C)O[Si](C)(C)C |
Title of publication | Monomeric malonate precursors for the MOCVD of HfO2 and ZrO2 thin films |
Authors of publication | Pothiraja, Ramasamy; Milanov, Andrian; Parala, Harish; Winter, Manuela; Fischer, Roland A.; Devi, Anjana |
Journal of publication | Dalton Transactions |
Year of publication | 2009 |
Journal issue | 4 |
Pages of publication | 654 |
a | 20.2381 ± 0.0006 Å |
b | 20.2381 ± 0.0006 Å |
c | 14.2483 ± 0.0006 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 5835.8 ± 0.3 Å3 |
Cell temperature | 115 ± 2 K |
Ambient diffraction temperature | 115 ± 2 K |
Number of distinct elements | 5 |
Space group number | 88 |
Hermann-Mauguin space group symbol | I 41/a :2 |
Hall space group symbol | -I 4ad |
Residual factor for all reflections | 0.0361 |
Residual factor for significantly intense reflections | 0.0265 |
Weighted residual factors for significantly intense reflections | 0.0586 |
Weighted residual factors for all reflections included in the refinement | 0.0622 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.024 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7000240.html
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