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Information card for entry 7000512
Preview
Coordinates | 7000512.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C28 H44 Cu6 I2 N8 S8 W2 |
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Calculated formula | C28 H44 Cu6 I2 N8 S8 W2 |
SMILES | [I]123[Cu]456[W]789%10(=S)[S]%11[Cu]%12%10([S]59)[I]54[Cu]493[S]3[W]9%10%13%14(=S)[S]([Cu]13%10[n]1c(cc(C)n1CCCCn1c(cc(C)[n]%121)C)C)[Cu]2%13([S]4%14)[n]1c(cc(C)n1CCCCn1c(cc(C)[n]1[Cu]57%11[S]68)C)C |
Title of publication | Formation of dimeric and polymeric W/Cu/S clusters via degradation or expansion of the cluster core in [Et4N]4[WS4Cu4I6] |
Authors of publication | Huang, Yu-Jian; Song, Ying-Lin; Chen, Yang; Li, Hong-Xi; Zhang, Yong; Lang, Jian-Ping |
Journal of publication | Dalton Transactions |
Year of publication | 2009 |
Journal issue | 8 |
Pages of publication | 1411 |
a | 16.422 ± 0.003 Å |
b | 17.978 ± 0.004 Å |
c | 16.105 ± 0.003 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 4754.8 ± 1.6 Å3 |
Cell temperature | 291 ± 2 K |
Ambient diffraction temperature | 291 ± 2 K |
Number of distinct elements | 7 |
Space group number | 64 |
Hermann-Mauguin space group symbol | C m c a |
Hall space group symbol | -C 2ac 2 |
Residual factor for all reflections | 0.0809 |
Residual factor for significantly intense reflections | 0.0674 |
Weighted residual factors for significantly intense reflections | 0.11 |
Weighted residual factors for all reflections included in the refinement | 0.115 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.096 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7000512.html
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Users of the data should acknowledge the original authors of the
structural data.