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Information card for entry 7000638
Preview
| Coordinates | 7000638.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C37 H48 N4 Ni O7 |
|---|---|
| Calculated formula | C37 H48 N4 Ni O7 |
| SMILES | [Ni]123Oc4c(C=[N]3c3c([N]2=Cc2c(O1)c(cc(c2)C(C)(C)C)C(C)(C)C)cc(N(=O)=O)c(N(=O)=O)c3)cc(cc4C(C)(C)C)C(C)(C)C.OC |
| Title of publication | One-electron oxidized nickel(II) complexes of bis and tetra(salicylidene) phenylenediamine Schiff bases: from monoradical to interacting Ni(III) ions |
| Authors of publication | Rotthaus, Olaf; Jarjayes, Olivier; Philouze, Christian; Del Valle, Carlos Pérez; Thomas, Fabrice |
| Journal of publication | Dalton Transactions |
| Year of publication | 2009 |
| Journal issue | 10 |
| Pages of publication | 1792 - 1800 |
| a | 12.029 ± 0.006 Å |
| b | 12.317 ± 0.004 Å |
| c | 13.16 ± 0.01 Å |
| α | 99.11 ± 0.04° |
| β | 102.79 ± 0.04° |
| γ | 100.68 ± 0.03° |
| Cell volume | 1827.6 ± 1.8 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0668 |
| Residual factor for significantly intense reflections | 0.0668 |
| Weighted residual factors for all reflections | 0.0899 |
| Weighted residual factors for all reflections included in the refinement | 0.0899 |
| Goodness-of-fit parameter for all reflections | 1.17 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.17 |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7000638.html
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Users of the data should acknowledge the original authors of the
structural data.