Information card for entry 7000798

Structure parameters

• Formula: C16 H36 Ni P2 Se4
• Calculated formula: C16 H36 Ni P2 Se4
• SMILES: C(C)(C)(C)P1(C(C)(C)C)=[Se][Ni]2([Se]1)[Se]=P(C(C)(C)C)(C(C)(C)C)[Se]2
• Title of publication: Synthesis of the nickel selenophosphinates [Ni(Se2PR2)2] (R = iPr, tBu and Ph) and their use as single source precursors for the deposition of nickel phosphide or nickel selenide nanoparticles
• Authors of publication: Maneeprakorn, Weerakanya; Nguyen, Chinh Q.; Malik, Mohammad A.; O'Brien, Paul; Raftery, James
• Journal of publication: Dalton Transactions
• Year of publication: 2009
• Journal issue: 12
• Pages of publication: 2103 - 2108
• a: 17.8391 ± 0.0008 Å
• b: 16.2638 ± 0.0007 Å
• c: 33.5402 ± 0.0015 Å
• α: 90°
• β: 94.165 ± 0.001°
• γ: 90°
• Cell volume: 9705.4 ± 0.7 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 5
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0888
• Residual factor for significantly intense reflections: 0.0515
• Weighted residual factors for significantly intense reflections: 0.0975
• Weighted residual factors for all reflections included in the refinement: 0.1107
• Goodness-of-fit parameter for all reflections included in the refinement: 1.009
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No