Information card for entry 7001232

Structure parameters

• Formula: C26 H34 Cl2 O5 Si2 Ti2
• Calculated formula: C26 H34 Cl2 O5 Si2 Ti2
• SMILES: [Ti]123456(Cl)O[Si]7(O[Si](O[Ti]89%10%11(Cl)(Oc%12c(O1)cccc%12)[c]17[c]8([c]9([c]%10([c]%111C)C)C)C)([c]12[c]3([c]4([c]5([c]61C)C)C)C)C)C
• Title of publication: Dinuclear dialkoxo-bridged cyclopentadienylsiloxo titanium complexes
• Authors of publication: Postigo, Lorena; Sánchez-Nieves, Javier; Royo, Pascual; Mosquera, Marta E. G.
• Journal of publication: Dalton Transactions
• Year of publication: 2009
• Journal issue: 19
• Pages of publication: 3756 - 3765
• a: 14.112 ± 0.003 Å
• b: 10.4098 ± 0.0007 Å
• c: 21.228 ± 0.003 Å
• α: 90°
• β: 104.083 ± 0.014°
• γ: 90°
• Cell volume: 3024.7 ± 0.8 ų
• Cell temperature: 200 ± 2 K
• Ambient diffraction temperature: 200 ± 2 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0808
• Residual factor for significantly intense reflections: 0.0441
• Weighted residual factors for significantly intense reflections: 0.1067
• Weighted residual factors for all reflections included in the refinement: 0.1184
• Goodness-of-fit parameter for all reflections included in the refinement: 1.039
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No