Information card for entry 7003834

Structure parameters

• Formula: C32 H72 Ge N2 P6 Si4
• Calculated formula: C32 H72 Ge N2 P6 Si4
• SMILES: [Ge]1(P2P3C4(P5C2(P2P1C3(P4C52C(C)(C)C)C(C)(C)C)C(C)(C)C)C(C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)N([Si](C)(C)C)[Si](C)(C)C
• Title of publication: Specific insertion reactions of a germylene, stannylene and plumbylene into the unique P‒P bond of the hexaphospha-pentaprismane cage, P6C4tBu4: Crystal and molecular structures of P6C4tBu4ER2 (E = Ge, Sn, R = N(SiMe3)2; E = Pb, R = (C6H3(NMe2)2 -2,6)
• Authors of publication: Al-Ktaifani, Mahmoud M.; Hitchcock, Peter B.; Lappert, Michael F.; Nixon, John F.; Uiterweerd, Philip
• Journal of publication: Dalton Transactions
• Year of publication: 2008
• Journal issue: 21
• Pages of publication: 2825 - 2831
• a: 18.0331 ± 0.0004 Å
• b: 18.1166 ± 0.0005 Å
• c: 24.3208 ± 0.0007 Å
• α: 82.831 ± 0.002°
• β: 69.414 ± 0.002°
• γ: 65.093 ± 0.002°
• Cell volume: 6743.9 ± 0.3 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0919
• Residual factor for significantly intense reflections: 0.0519
• Weighted residual factors for significantly intense reflections: 0.0926
• Weighted residual factors for all reflections included in the refinement: 0.1072
• Goodness-of-fit parameter for all reflections included in the refinement: 1.014
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: No