Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7004172
Preview
Coordinates | 7004172.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C32 H44 F I2 Na O6 Sn2 |
---|---|
Calculated formula | C32 H44 F I2 Na O6 Sn2 |
SMILES | [Na]1234([O]5CC(C[Sn]6(I)(c7ccccc7)[F]([Sn](I)(c7ccccc7)(c7ccccc7)C6))C[O]1CC[O]3CC[O]4CC[O]2CC5)[OH]C |
Title of publication | Charge separation by ditopic complexation in the solid state: molecular structure of {Ph2(I)SnCH2Sn(Ph)(I)CH2-[16]-crown-5}·NaF·CH3OH |
Authors of publication | Reeske, Gregor; Schürmann, Markus; Jurkschat, Klaus |
Journal of publication | Dalton Transactions |
Year of publication | 2008 |
Journal issue | 26 |
Pages of publication | 3398 - 3400 |
a | 10.2796 ± 0.0007 Å |
b | 19.1814 ± 0.0016 Å |
c | 19.5578 ± 0.0009 Å |
α | 90° |
β | 92.51 ± 0.004° |
γ | 90° |
Cell volume | 3852.7 ± 0.5 Å3 |
Cell temperature | 173 ± 1 K |
Ambient diffraction temperature | 173 ± 1 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0842 |
Residual factor for significantly intense reflections | 0.0281 |
Weighted residual factors for significantly intense reflections | 0.0396 |
Weighted residual factors for all reflections included in the refinement | 0.0439 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.651 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7004172.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.