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Information card for entry 7004581
Preview
Coordinates | 7004581.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C44 H39 F5 P2 Ru |
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Calculated formula | C44 H39 F5 P2 Ru |
SMILES | [Ru]12345([P](c6ccccc6)(c6ccccc6)CC[P]1(c1ccccc1)c1ccccc1)(C#Cc1c(F)c(F)c(F)c(F)c1F)[c]1([c]2(C)[c]3([c]4(C)[c]51C)C)C |
Title of publication | Some transition metal complexes derived from mono- and di-ethynyl perfluorobenzenes |
Authors of publication | Armitt, David J.; Bruce, Michael I.; Gaudio, Maryka; Zaitseva, Natasha N.; Skelton, Brian W.; White, Allan H.; Le Guennic, Boris; Halet, Jean-François; Fox, Mark A.; Roberts, Rachel L.; Hartl, František; Low, Paul J. |
Journal of publication | Dalton Transactions |
Year of publication | 2008 |
Journal issue | 47 |
Pages of publication | 6763 - 6775 |
a | 8.605 ± 0.001 Å |
b | 25.438 ± 0.003 Å |
c | 17.212 ± 0.002 Å |
α | 90° |
β | 100.864 ± 0.002° |
γ | 90° |
Cell volume | 3700.1 ± 0.7 Å3 |
Cell temperature | 170 K |
Ambient diffraction temperature | 170 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.058 |
Residual factor for significantly intense reflections | 0.044 |
Weighted residual factors for significantly intense reflections | 0.08 |
Weighted residual factors for all reflections included in the refinement | 0.111 |
Goodness-of-fit parameter for significantly intense reflections | 0.962 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.072 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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