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Information card for entry 7005186
Preview
Coordinates | 7005186.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C36 H84 Cu3 N3 P6 Te6 |
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Calculated formula | C36 H84 Cu3 N3 P6 Te6 |
SMILES | P1(=NP(=[Te]2[Cu]34([Te]1)[Te]1=P(N=P([Te]3[Cu]341[Te]1=P(N=P([Te][Cu]231)(C(C)C)C(C)C)(C(C)C)C(C)C)(C(C)C)C(C)C)(C(C)C)C(C)C)(C(C)C)C(C)C)(C(C)C)C(C)C |
Title of publication | Syntheses, X-ray structures and AACVD studies of group 11 ditelluroimidodiphosphinate complexes. |
Authors of publication | Copsey, May C.; Panneerselvam, Arunkumar; Afzaal, Mohammad; Chivers, Tristram; O'Brien, Paul |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2007 |
Journal issue | 15 |
Pages of publication | 1528 - 1538 |
a | 14.0073 ± 0.0003 Å |
b | 14.4237 ± 0.0004 Å |
c | 16.5375 ± 0.0004 Å |
α | 83.975 ± 0.001° |
β | 76.891 ± 0.002° |
γ | 62.512 ± 0.001° |
Cell volume | 2886.75 ± 0.13 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0718 |
Residual factor for significantly intense reflections | 0.0511 |
Weighted residual factors for significantly intense reflections | 0.1313 |
Weighted residual factors for all reflections included in the refinement | 0.1445 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.065 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7005186.html
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Users of the data should acknowledge the original authors of the
structural data.