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Information card for entry 7005220
Preview
Coordinates | 7005220.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C31 H56 Cs F3 N2 O10 S4 Te |
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Calculated formula | C31 H56 Cs F3 N2 O10 S4 Te |
SMILES | [Te](C(F)(F)F)(SC(=S)N1CCCC1)SC(=S)N1CCCC1.[Cs]123456([O]7CC[O]1CC[O]2CC[O]3CC[O]4CC7)[O]1CC[O]5CCOCC[O]6CCOCC1 |
Title of publication | Perfluoroalkyl(dithiocarbamato) tellurium(II) compounds. |
Authors of publication | Tyrra, Wieland; Naumann, Dieter; Buslei, Sigrid; Kremer, Silke; Pantenburg, Ingo; Scherer, Harald |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2007 |
Journal issue | 18 |
Pages of publication | 1829 - 1837 |
a | 13.1917 ± 0.0013 Å |
b | 13.1781 ± 0.0014 Å |
c | 14.9388 ± 0.0015 Å |
α | 87.971 ± 0.008° |
β | 78.721 ± 0.008° |
γ | 61.217 ± 0.007° |
Cell volume | 2226.9 ± 0.4 Å3 |
Cell temperature | 170 ± 2 K |
Ambient diffraction temperature | 170 ± 2 K |
Number of distinct elements | 8 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0871 |
Residual factor for significantly intense reflections | 0.0689 |
Weighted residual factors for significantly intense reflections | 0.1893 |
Weighted residual factors for all reflections included in the refinement | 0.203 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.066 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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