Information card for entry 7005790

Structure parameters

• Formula: C72 H116 Eu2 N4 O5
• Calculated formula: C72 H116 Eu2 N4 O5
• SMILES: [Eu]1234[O](c5c(cc(cc5C[N]5(Cc6c(O7)c(cc(c6)C(C)(C)C)C(C)(C)C)CC[N]6(C)C)C(C)(C)C)C(C)(C)C)[Eu]567[O]1c1c(cc(cc1C[N]4(Cc1cc(cc(c1O2)C(C)(C)C)C(C)(C)C)CC[N]3(C)C)C(C)(C)C)C(C)(C)C.O1CCCC1
• Title of publication: Synthesis and structural characterization of novel mixed-valent samarium and divalent ytterbium and europium complexes supported by amine bis(phenolate) ligands.
• Authors of publication: Guo, Huadong; Zhou, Hui; Yao, Yingming; Zhang, Yong; Shen, Qi
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2007
• Journal issue: 32
• Pages of publication: 3555 - 3561
• a: 9.676 ± 0.0011 Å
• b: 14.2953 ± 0.0019 Å
• c: 27.072 ± 0.004 Å
• α: 88.847 ± 0.009°
• β: 86.999 ± 0.009°
• γ: 84.992 ± 0.007°
• Cell volume: 3724.8 ± 0.9 ų
• Cell temperature: 193 ± 2 K
• Ambient diffraction temperature: 193 ± 2 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.1171
• Residual factor for significantly intense reflections: 0.0867
• Weighted residual factors for significantly intense reflections: 0.1894
• Weighted residual factors for all reflections included in the refinement: 0.2103
• Goodness-of-fit parameter for all reflections included in the refinement: 1.106
• Diffraction radiation wavelength: 0.7107 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No