Information card for entry 7006084

Structure parameters

• Formula: C33 H56 N O3 S Si Y
• Calculated formula: C33 H56 N O3 S Si Y
• SMILES: [Y]1(N(Cc2sccc12)c1c(cccc1C(C)C)C(C)C)([O]1CCCC1)([O]1CCCC1)([O]1CCCC1)C[Si](C)(C)C
• Title of publication: Rare earth metal complexes bearing thiophene-amido ligand: synthesis and structural characterization.
• Authors of publication: Wang, Dun; Cui, Dongmei; Miao, Wei; Li, Shihui; Huang, Baotong
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2007
• Journal issue: 40
• Pages of publication: 4576 - 4581
• a: 10.1278 ± 0.0007 Å
• b: 18.1189 ± 0.0012 Å
• c: 19.4029 ± 0.0013 Å
• α: 90°
• β: 94.255 ± 0.001°
• γ: 90°
• Cell volume: 3550.7 ± 0.4 ų
• Cell temperature: 187 ± 2 K
• Ambient diffraction temperature: 187 ± 2 K
• Number of distinct elements: 7
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0737
• Residual factor for significantly intense reflections: 0.0433
• Weighted residual factors for significantly intense reflections: 0.093
• Weighted residual factors for all reflections included in the refinement: 0.1038
• Goodness-of-fit parameter for all reflections included in the refinement: 0.983
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No