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Information card for entry 7006172
Preview
Coordinates | 7006172.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C48 H54 Cu N2 O2 P3 S2 |
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Calculated formula | C48 H54 Cu N2 O2 P3 S2 |
SMILES | [Cu]1([S]=P(N=C(S1)N1CCCCC1)(OC(C)C)OC(C)C)([P](c1ccccc1)(c1ccccc1)c1ccccc1)[P](c1ccccc1)(c1ccccc1)c1ccccc1 |
Title of publication | Complexes of N-thiophosphorylthioureas (HL) with copper(I). Crystal structures of [Cu3L3] and [Cu(PPh3)2L] chelates. |
Authors of publication | Sokolov, Felix D.; Babashkina, Maria G.; Safin, Damir A.; Rakhmatullin, Aydar I.; Fayon, Franck; Zabirov, Nail G.; Bolte, Michael; Brusko, Vasiliy V.; Galezowska, Joanna; Kozlowski, Henryk |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2007 |
Journal issue | 41 |
Pages of publication | 4693 - 4700 |
a | 12.9095 ± 0.0007 Å |
b | 21.2619 ± 0.0008 Å |
c | 17.5378 ± 0.0009 Å |
α | 90° |
β | 109.403 ± 0.004° |
γ | 90° |
Cell volume | 4540.4 ± 0.4 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0482 |
Residual factor for significantly intense reflections | 0.0376 |
Weighted residual factors for significantly intense reflections | 0.0776 |
Weighted residual factors for all reflections included in the refinement | 0.0806 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.095 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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