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Information card for entry 7006334
Preview
Coordinates | 7006334.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C36 H81 N6 Na3 Si3 |
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Calculated formula | C36 H81 N6 Na3 Si3 |
SMILES | C(C)(C)([N]1([Si](C)(C)C)[Na]([N](C(C)(C)C)([Na]([N](C(C)(C)C)([Na]1[N]#CC(C)(C)C)[Si](C)(C)C)[N]#CC(C)(C)C)[Si](C)(C)C)[N]#CC(C)(C)C)C |
Title of publication | Reactions between a sodium amide Na[N(SiMe3)R1] (R1 = SiMe3, SiMe2Ph or But) and a cyanoalkane RCN (R = Ad or Bu(t)). |
Authors of publication | Avent, Anthony G.; Antolini, Floria; Hitchcock, Peter B.; Khvostov, Alexei V.; Lappert, Michael F.; Protchenko, Andrey V. |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2006 |
Journal issue | 7 |
Pages of publication | 919 - 927 |
a | 11.1936 ± 0.0002 Å |
b | 11.7449 ± 0.0002 Å |
c | 39.5782 ± 0.0005 Å |
α | 90° |
β | 92.796 ± 0.001° |
γ | 90° |
Cell volume | 5197.06 ± 0.14 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.1112 |
Residual factor for significantly intense reflections | 0.0895 |
Weighted residual factors for significantly intense reflections | 0.2381 |
Weighted residual factors for all reflections included in the refinement | 0.2552 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.065 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7006334.html
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Users of the data should acknowledge the original authors of the
structural data.