Information card for entry 7006839

Structure parameters

• Common name: (K(dme)4)((Si(NEt)2C6H4)4).(dme)
• Formula: C60 H106 K N8 O10 Si4
• Calculated formula: C60 H106 K N8 O10 Si4
• SMILES: [K]1234([O](CC[O]1C)C)([O](CC[O]2C)C)([O](CC[O]3C)C)[O](CC[O]4C)C.[Si]12([Si]3([Si]4([Si]51N(c1c(N5CC)cccc1)CC)N(c1c(N4CC)cccc1)CC)N(c1c(N3CC)cccc1)CC)N(c1c(N2CC)cccc1)CC.O(CCOC)C
• Title of publication: Insights into the making of a stable silylene.
• Authors of publication: Gehrhus, Barbara; Hitchcock, Peter B.; Pongtavornpinyo, Ruti; Zhang, Lihong
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2006
• Journal issue: 15
• Pages of publication: 1847 - 1857
• a: 18.794 ± 0.0004 Å
• b: 18.5198 ± 0.0004 Å
• c: 20.7545 ± 0.0005 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 7223.8 ± 0.3 ų
• Cell temperature: 223 ± 2 K
• Ambient diffraction temperature: 223 ± 2 K
• Number of distinct elements: 6
• Space group number: 33
• Hermann-Mauguin space group symbol: P n a 21
• Hall space group symbol: P 2c -2n
• Residual factor for all reflections: 0.0814
• Residual factor for significantly intense reflections: 0.0567
• Weighted residual factors for significantly intense reflections: 0.1093
• Weighted residual factors for all reflections included in the refinement: 0.1191
• Goodness-of-fit parameter for all reflections included in the refinement: 1.065
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No