Information card for entry 7006846

Structure parameters

• Common name: ((C6H4(NCH2tBu)2Si(Cl))2)
• Formula: C32 H52 Cl2 N4 Si2
• Calculated formula: C32 H52 Cl2 N4 Si2
• SMILES: c12c(cccc1)N([Si](Cl)(N2CC(C)(C)C)[Si]1(Cl)N(c2c(cccc2)N1CC(C)(C)C)CC(C)(C)C)CC(C)(C)C
• Title of publication: Insights into the making of a stable silylene.
• Authors of publication: Gehrhus, Barbara; Hitchcock, Peter B.; Pongtavornpinyo, Ruti; Zhang, Lihong
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2006
• Journal issue: 15
• Pages of publication: 1847 - 1857
• a: 14.1952 ± 0.0014 Å
• b: 20.166 ± 0.003 Å
• c: 12.5955 ± 0.0014 Å
• α: 90°
• β: 97.602 ± 0.006°
• γ: 90°
• Cell volume: 3573.9 ± 0.8 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 5
• Space group number: 15
• Hermann-Mauguin space group symbol: C 1 2/c 1
• Hall space group symbol: -C 2yc
• Residual factor for all reflections: 0.0831
• Residual factor for significantly intense reflections: 0.05
• Weighted residual factors for significantly intense reflections: 0.0996
• Weighted residual factors for all reflections included in the refinement: 0.1113
• Goodness-of-fit parameter for all reflections included in the refinement: 1.015
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No