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Information card for entry 7008784
Preview
Coordinates | 7008784.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C324 H268 Cl8 N13 O24 P12 Rh12 |
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Calculated formula | C324 H260 Cl8 N13 O24 P12 Rh12 |
SMILES | [Rh]1234([Rh]5([P](c6c4cccc6)(c4ccccc4)c4ccccc4)([O]=C(O2)c2cc4cc(c2)C2=[O][Rh]678([Rh]([P](c9c8cccc9)(c8ccccc8)c8ccccc8)([O]=C(O7)c7cc8cc(c7)C7=[O][Rh]9%10%11([Rh]([P](c%12c%11cccc%12)(c%11ccccc%11)c%11ccccc%11)(O7)([O]=C(O%10)c7cc(cc(c7)C7=[O][Rh]%10%11%12([Rh]([P](c%13c%12cccc%13)(c%12ccccc%12)c%12ccccc%12)(O7)([O]=C(O%11)c7cc(cc(c7)C7=[O][Rh]%11%12%13([Rh]([P](c%14c%13cccc%14)(c%13ccccc%13)c%13ccccc%13)([O]=C8O%12)(O7)(c7c([P]%11(c8ccccc8)c8ccccc8)cccc7)[n]7ccccc7)[n]7ccccc7)C(=[O]3)O5)(c3c([P]%10(c5ccccc5)c5ccccc5)cccc3)[n]3ccccc3)[n]3ccccc3)C3=[O][Rh]578([Rh]([P](c%10c8cccc%10)(c8ccccc8)c8ccccc8)(O3)([O]=C4O7)(c3c([P]5(c4ccccc4)c4ccccc4)cccc3)[n]3ccccc3)[n]3ccccc3)(c3c([P]9(c4ccccc4)c4ccccc4)cccc3)[n]3ccccc3)[n]3ccccc3)(O2)(c2c([P]6(c3ccccc3)c3ccccc3)cccc2)[n]2ccccc2)[n]2ccccc2)(c2c([P]1(c1ccccc1)c1ccccc1)cccc2)[n]1ccccc1)[n]1ccccc1.[N+](CC)(CC)(CC)CC.C(Cl)Cl.C(Cl)Cl.C(Cl)Cl.C(Cl)Cl |
Title of publication | Deliberate synthesis of the preselected enantiomer of an enantiorigid molecule with pure rotational symmetry T. |
Authors of publication | Cotton, F. Albert; Murillo, Carlos A.; Yu, Rongmin |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2005 |
Journal issue | 19 |
Pages of publication | 3161 - 3165 |
a | 28.9 ± 0.015 Å |
b | 23.14 ± 0.011 Å |
c | 32.715 ± 0.016 Å |
α | 90° |
β | 101.917 ± 0.009° |
γ | 90° |
Cell volume | 21407 ± 18 Å3 |
Cell temperature | 183 ± 2 K |
Ambient diffraction temperature | 183 ± 2 K |
Number of distinct elements | 7 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.2454 |
Residual factor for significantly intense reflections | 0.1858 |
Weighted residual factors for significantly intense reflections | 0.4223 |
Weighted residual factors for all reflections included in the refinement | 0.4582 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.467 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7008784.html
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