Information card for entry 7008951

Structure parameters

• Formula: C24 H56 N2 P4 Se4 Te
• Calculated formula: C24 H56 N2 P4 Se4 Te
• SMILES: C(P1(C(C)C)=NP(C(C)C)(C(C)C)=[Se][Te]2([Se]1)[Se]=P(C(C)C)(C(C)C)N=P(C(C)C)(C(C)C)[Se]2)(C)C
• Title of publication: Synthesis and crystal structures of tellurium complexes containing imidophosphinate ligands
• Authors of publication: Birdsall, David J.; Novosad, Josef; Slawin, Alexandra M. Z.; Woollins, J. Derek
• Journal of publication: Journal of the Chemical Society, Dalton Transactions
• Year of publication: 2000
• Journal issue: 4
• Pages of publication: 435
• a: 10.4104 ± 0.0007 Å
• b: 14.7541 ± 0.0011 Å
• c: 12.1815 ± 0.0008 Å
• α: 90°
• β: 98.739 ± 0.002°
• γ: 90°
• Cell volume: 1849.3 ± 0.2 ų
• Cell temperature: 293 ± 2 K
• Ambient diffraction temperature: 293 ± 2 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0441
• Residual factor for significantly intense reflections: 0.0249
• Weighted residual factors for all reflections: 0.0525
• Weighted residual factors for significantly intense reflections: 0.0425
• Goodness-of-fit parameter for all reflections: 0.911
• Goodness-of-fit parameter for significantly intense reflections: 0.98
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No