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Information card for entry 7009030
Preview
Coordinates | 7009030.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C44 H42 Cu4 N8 O6 |
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Calculated formula | C44 H40 Cu4 N8 O6 |
SMILES | [Cu]123[N](=Cc4c(O2)cccc4)CC2=[O]1[Cu]1(Oc4c(C=[N]1C2)cccc4)[n]1n3c(C)c(c1C)c1c(n2[Cu]34Oc5ccccc5C=[N]4CC4=[O]3[Cu]3([N](C4)=Cc4ccccc4O3)[n]2c1C)C |
Title of publication | Tetranuclear copper(II) complexes incorporating short and long metal‒metal separations: synthesis, structure and magnetism † |
Authors of publication | Kruger, Paul E.; Moubaraki, Boujemaa; Fallon, Gary D.; Murray, Keith S. |
Journal of publication | Journal of the Chemical Society, Dalton Transactions |
Year of publication | 2000 |
Journal issue | 5 |
Pages of publication | 713 |
a | 18.63 ± 0.002 Å |
b | 12.459 ± 0.001 Å |
c | 9.319 ± 0.001 Å |
α | 81.546 ± 0.008° |
β | 86.965 ± 0.006° |
γ | 76.897 ± 0.008° |
Cell volume | 2083.4 ± 0.4 Å3 |
Cell temperature | 293.2 K |
Ambient diffraction temperature | 293.2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0555 |
Residual factor for significantly intense reflections | 0.0388 |
Weighted residual factors for all reflections | 0.0641 |
Weighted residual factors for all reflections included in the refinement | 0.0492 |
Goodness-of-fit parameter for all reflections | 1.761 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.578 |
Diffraction radiation wavelength | 1.5418 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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