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Information card for entry 7009376
Preview
Coordinates | 7009376.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C28 H60 Si6 Zr |
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Calculated formula | C28 H60 Si6 Zr |
SMILES | [CH]1([Si](C)(C)C)=[CH]2[Zr]13456789%10([CH](=[CH]%10[Si](C)(C)C)C9[Si](C4[CH]6=[CH]8[Si](C)(C)C)(C)C)C2[Si](C3[CH]5=[CH]7[Si](C)(C)C)(C)C |
Title of publication | Synthesis and structural characterisation of new ansa-bis(propene)s and {ansa-bis(allyl)}alkali metal and {ansa-bis(allyl)}transition metal complexes |
Authors of publication | Fernández-Galán, Rafael; Hitchcock, Peter B.; Lappert, Michael F.; Antiñolo, Antonio; Rodríguez, Ana M. |
Journal of publication | Journal of the Chemical Society, Dalton Transactions |
Year of publication | 2000 |
Journal issue | 11 |
Pages of publication | 1743 |
a | 11.512 ± 0.002 Å |
b | 17.267 ± 0.003 Å |
c | 19.367 ± 0.002 Å |
α | 90° |
β | 103.39 ± 0.02° |
γ | 90° |
Cell volume | 3745.1 ± 1 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 4 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.1216 |
Residual factor for significantly intense reflections | 0.0627 |
Weighted residual factors for all reflections | 0.1661 |
Weighted residual factors for significantly intense reflections | 0.1357 |
Goodness-of-fit parameter for all reflections | 1.043 |
Goodness-of-fit parameter for significantly intense reflections | 1.096 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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