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Information card for entry 7009561
Preview
Coordinates | 7009561.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C56 H73 O2 P Ru Si2 |
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Calculated formula | C56 H73 O2 P Ru Si2 |
SMILES | [Ru]123456([P](c7ccccc7)(c7ccccc7)c7ccccc7)([CH](C(=O)OC)=[C]1(/C=C/[Si](C)(C)C)C2=C(c1ccccc1)C#C[Si](C)(C)C)[c]1(C)[c]3([c]4(C)[c]5([c]61C)C)C.CCCCCC |
Title of publication | Oligomerisation of alkynes at a pentamethylcyclopentadienylruthenium centre † |
Authors of publication | Bruce, Michael I.; Hall, Ben C.; Skelton, Brian W.; White, Allan H.; Zaitseva, Natasha N. |
Journal of publication | Journal of the Chemical Society, Dalton Transactions |
Year of publication | 2000 |
Journal issue | 14 |
Pages of publication | 2279 |
a | 10.9167 ± 0.0008 Å |
b | 16.7444 ± 0.0011 Å |
c | 16.9819 ± 0.0012 Å |
α | 63.452 ± 0.001° |
β | 78.627 ± 0.001° |
γ | 84.008 ± 0.001° |
Cell volume | 2721.9 ± 0.3 Å3 |
Cell temperature | 293 K |
Ambient diffraction temperature | 293 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.068 |
Residual factor for significantly intense reflections | 0.0415 |
Weighted residual factors for all reflections | 0.054 |
Weighted residual factors for all reflections included in the refinement | 0.0505 |
Goodness-of-fit parameter for all reflections | 1.259 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.421 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7009561.html
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