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Information card for entry 7010208
Preview
Coordinates | 7010208.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C74 H66 Cl F6 P5 Pt2 Se2 Sn |
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Calculated formula | C74 H66 Cl F6 P5 Pt2 Se2 Sn |
SMILES | [Pt]1([Se]2[Pt]([Se]1[Sn]2(Cl)(C)C)([P](c1ccccc1)(c1ccccc1)c1ccccc1)[P](c1ccccc1)(c1ccccc1)c1ccccc1)([P](c1ccccc1)(c1ccccc1)c1ccccc1)[P](c1ccccc1)(c1ccccc1)c1ccccc1.[P](F)(F)(F)(F)(F)[F-] |
Title of publication | Probing the Lewis basicity of the metalloligand [Pt2(μ-Se)2(PPh3)4] on tin substrates by electrospray mass spectrometry |
Authors of publication | Yeo, Jeremy S. L.; Vittal, Jagadese J.; Henderson, William; Andy Hor, T. S. |
Journal of publication | Journal of the Chemical Society, Dalton Transactions |
Year of publication | 2001 |
Journal issue | 3 |
Pages of publication | 315 |
a | 20.215 ± 0.0003 Å |
b | 19.524 Å |
c | 18.0565 ± 0.0003 Å |
α | 90° |
β | 91.88° |
γ | 90° |
Cell volume | 7122.66 ± 0.16 Å3 |
Cell temperature | 203 ± 2 K |
Ambient diffraction temperature | 203 ± 2 K |
Number of distinct elements | 8 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0488 |
Residual factor for significantly intense reflections | 0.0345 |
Weighted residual factors for significantly intense reflections | 0.0553 |
Weighted residual factors for all reflections included in the refinement | 0.0586 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.081 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7010208.html
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