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Information card for entry 7010210
Preview
Coordinates | 7010210.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C80 H78 Cl F6 P5 Pt2 Se2 Sn2 |
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Calculated formula | C80 H73 Cl F6 P5 Pt2 Se2 Sn |
Title of publication | Probing the Lewis basicity of the metalloligand [Pt2(μ-Se)2(PPh3)4] on tin substrates by electrospray mass spectrometry |
Authors of publication | Yeo, Jeremy S. L.; Vittal, Jagadese J.; Henderson, William; Andy Hor, T. S. |
Journal of publication | Journal of the Chemical Society, Dalton Transactions |
Year of publication | 2001 |
Journal issue | 3 |
Pages of publication | 315 |
a | 12.337 ± 0.002 Å |
b | 16.102 ± 0.005 Å |
c | 21.258 ± 0.005 Å |
α | 86.54 ± 0.02° |
β | 86.82 ± 0.02° |
γ | 87.8 ± 0.02° |
Cell volume | 4206.1 ± 1.8 Å3 |
Cell temperature | 223 ± 2 K |
Ambient diffraction temperature | 223 ± 2 K |
Number of distinct elements | 8 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0571 |
Residual factor for significantly intense reflections | 0.0427 |
Weighted residual factors for all reflections | 0.1324 |
Weighted residual factors for significantly intense reflections | 0.1211 |
Goodness-of-fit parameter for all reflections | 0.963 |
Goodness-of-fit parameter for significantly intense reflections | 0.976 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7010210.html
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