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Information card for entry 7010415
Preview
Coordinates | 7010415.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C32 H64 Mg2 N4 O2 Si4 |
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Calculated formula | C32 H64 Mg2 N4 O2 Si4 |
SMILES | [Mg]1([O]2CCCC2)(N([Si](C)(C)C)[Si](C)(C)C)[NH](c2ccccc2)[Mg]([O]2CCCC2)(N([Si](C)(C)C)[Si](C)(C)C)[NH]1c1ccccc1 |
Title of publication | Synthesis and crystal structure of the new heteroleptic magnesium bis(amide) [{Mg[μ-N(H)Ph][N(SiMe3)2]·THF }2], and density functional MO calculations on model systems † |
Authors of publication | Armstrong, David R.; Clegg, William; Mulvey, Robert E.; Rowlings, René B. |
Journal of publication | Journal of the Chemical Society, Dalton Transactions |
Year of publication | 2001 |
Journal issue | 4 |
Pages of publication | 409 |
a | 8.9338 ± 0.0004 Å |
b | 21.3111 ± 0.001 Å |
c | 10.8059 ± 0.0005 Å |
α | 90° |
β | 95.616 ± 0.002° |
γ | 90° |
Cell volume | 2047.45 ± 0.16 Å3 |
Cell temperature | 160 ± 2 K |
Ambient diffraction temperature | 160 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0358 |
Residual factor for significantly intense reflections | 0.0299 |
Weighted residual factors for all reflections | 0.0803 |
Weighted residual factors for significantly intense reflections | 0.077 |
Goodness-of-fit parameter for all reflections | 1.091 |
Goodness-of-fit parameter for significantly intense reflections | 1.112 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7010415.html
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