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Information card for entry 7010428
Preview
| Coordinates | 7010428.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C55 H45 N Ni O P2 S Se2 |
|---|---|
| Calculated formula | C55 H45 N Ni O P2 S Se2 |
| Title of publication | Distorted square planar nickel(II) carbonyl complexes containing terminal thiolate/selenolate ligands |
| Authors of publication | Liaw, Wen-Feng; Chen, Chien-Hong; Lee, Chien-Ming; Lee, Gene-Hsiang; Peng, Shie-Ming |
| Journal of publication | Journal of the Chemical Society, Dalton Transactions |
| Year of publication | 2001 |
| Journal issue | 2 |
| Pages of publication | 138 |
| a | 10.114 ± 0.003 Å |
| b | 15.504 ± 0.003 Å |
| c | 16.402 ± 0.003 Å |
| α | 73.35 ± 0.02° |
| β | 87.06 ± 0.02° |
| γ | 87.5 ± 0.02° |
| Cell volume | 2459.8 ± 1 Å3 |
| Cell temperature | 295 ± 2 K |
| Ambient diffraction temperature | 295 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.2318 |
| Residual factor for significantly intense reflections | 0.0968 |
| Weighted residual factors for all reflections | 0.1923 |
| Weighted residual factors for significantly intense reflections | 0.1619 |
| Goodness-of-fit parameter for all reflections | 1.051 |
| Goodness-of-fit parameter for significantly intense reflections | 1.561 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7010428.html
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