Information card for entry 7010491

Structure parameters

• Common name: nov1699
• Formula: C24 H44 Li2 N4 Si2
• Calculated formula: C24 H44 Li2 N4 Si2
• SMILES: [Li]1[N]([Si](C)(C)C)(c2ccccc2)[Li]([N]1([Si](C)(C)C)c1ccccc1)[N](C)(C)CC[N](C)(C)[Li]1[N]([Si](C)(C)C)(c2ccccc2)[Li]([N]1([Si](C)(C)C)c1ccccc1)[N](C)(C)CCN(C)(C)
• Title of publication: Synthesis and structures of lithium N-trimethylsilyl- and -neopentyl-anilides and their Et2O and tmen adducts; crystal structures of [(Li{μ-N(Ph)R}-trans)2(μ-tmen)]\ιnfty (R = SiMe3 1 or CH2But 2) and [Li{μ-N(Ph)CH2But}(OEt2)]2 †
• Authors of publication: Bezombes, Jean Philippe; Hitchcock, Peter B.; Lappert, Michael F.; Merle, Philippe G.
• Journal of publication: Journal of the Chemical Society, Dalton Transactions
• Year of publication: 2001
• Journal issue: 6
• Pages of publication: 816
• a: 9.259 ± 0.001 Å
• b: 18.225 ± 0.002 Å
• c: 9.3338 ± 0.0007 Å
• α: 90°
• β: 118.617 ± 0.006°
• γ: 90°
• Cell volume: 1382.6 ± 0.2 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 5
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.1079
• Residual factor for significantly intense reflections: 0.0815
• Weighted residual factors for significantly intense reflections: 0.189
• Weighted residual factors for all reflections included in the refinement: 0.2
• Goodness-of-fit parameter for all reflections included in the refinement: 1.186
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No