Information card for entry 7011316

Structure parameters

• Formula: C2 H5 Cu O4 P
• Calculated formula: C2 H5 Cu O4 P
• Title of publication: Rhodium-mediated delamination of layered copper and zinc vinylphosphonates
• Authors of publication: D. Andrew Knight; Vinny Kim; Raymond J. Butcher; Brandy A. Harper; Terence L. Schull
• Journal of publication: J. Chem. Soc., Dalton Trans.
• Year of publication: 2002
• Journal issue: 6
• Pages of publication: 824 - 826
• a: 9.878 ± 0.005 Å
• b: 7.628 ± 0.003 Å
• c: 7.332 ± 0.003 Å
• α: 90°
• β: 95.97 ± 0.03°
• γ: 90°
• Cell volume: 549.5 ± 0.4 ų
• Cell temperature: 293 ± 2 K
• Ambient diffraction temperature: 293 ± 2 K
• Number of distinct elements: 5
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0518
• Residual factor for significantly intense reflections: 0.0487
• Weighted residual factors for significantly intense reflections: 0.1187
• Weighted residual factors for all reflections included in the refinement: 0.1216
• Goodness-of-fit parameter for all reflections included in the refinement: 1.11
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No