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Information card for entry 7011480
Preview
| Coordinates | 7011480.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | [HgCl{C(SiMe3)2(SiMe2C5H4N)}] |
|---|---|
| Formula | C14 H28 Cl Hg N Si3 |
| Calculated formula | C14 H28 Cl Hg N Si3 |
| SMILES | [Hg]1(Cl)C([Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)c2[n]1cccc2 |
| Title of publication | Synthesis and structures of compounds of Groups 11 and 12 containing the ligand C(SiMe3)2(SiMe2C5H4N-2) |
| Authors of publication | Eaborn, Colin; Hill, Michael S.; Hitchcock, Peter B.; Smith, J. David |
| Journal of publication | Journal of the Chemical Society, Dalton Transactions |
| Year of publication | 2002 |
| Journal issue | 12 |
| Pages of publication | 2467 |
| a | 12.5563 ± 0.0003 Å |
| b | 12.4249 ± 0.0003 Å |
| c | 13.2254 ± 0.0003 Å |
| α | 90° |
| β | 92.161 ± 0.002° |
| γ | 90° |
| Cell volume | 2061.84 ± 0.08 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0308 |
| Residual factor for significantly intense reflections | 0.0254 |
| Weighted residual factors for significantly intense reflections | 0.0642 |
| Weighted residual factors for all reflections included in the refinement | 0.0682 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.833 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7011480.html
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