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Information card for entry 7011567
Preview
| Coordinates | 7011567.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H18 N2 Ni S10 |
|---|---|
| Calculated formula | C24 H18 N2 Ni S10 |
| SMILES | [Ni]123(SC4SC(=S)SC=4[S]1Cc1c(C[S]3C3SC(=S)SC=3S2)cccc1)([n]1ccccc1)[n]1ccccc1 |
| Title of publication | A new family of sulfur-rich ligands based on the dmit system: synthesis and metal complexation of 4‒4'-covalently bridged bis(2-thioxo-1,3-dithiol-5-thiolato) units |
| Authors of publication | Allen, David W.; Berridge, Rory; Bricklebank, Neil; Cerrada, Elena; Light, Mark E.; Hursthouse, Michael B.; Laguna, Mariano; Moreno, Ana; Skabara, Peter J. |
| Journal of publication | Journal of the Chemical Society, Dalton Transactions |
| Year of publication | 2002 |
| Journal issue | 13 |
| Pages of publication | 2654 |
| a | 9.5662 ± 0.0006 Å |
| b | 12.5254 ± 0.0008 Å |
| c | 14.0131 ± 0.0008 Å |
| α | 76.558 ± 0.003° |
| β | 86.314 ± 0.003° |
| γ | 67.969 ± 0.003° |
| Cell volume | 1513.33 ± 0.17 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1009 |
| Residual factor for significantly intense reflections | 0.0517 |
| Weighted residual factors for significantly intense reflections | 0.1149 |
| Weighted residual factors for all reflections included in the refinement | 0.1364 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.017 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.