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Information card for entry 7011575
Preview
| Coordinates | 7011575.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C45 H48 Cl8 P4 Pd2 |
|---|---|
| Calculated formula | C45 H48 Cl8 P4 Pd2 |
| SMILES | [Pd]12([Pd]3([P](CC[P]1(CC[P]2(c1ccccc1)c1ccccc1)CC[P]3(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)Cl)Cl.ClCCl.ClCCl.ClCCl |
| Title of publication | P(CH2CH2PPh2)3 Bridged Group 10 dimetal centres |
| Authors of publication | Wachtler, Helmuth; Schuh, Walter; Ongania, Karl-Hans; Kopacka, Holger; Wurst, Klaus; Peringer, Paul |
| Journal of publication | Journal of the Chemical Society, Dalton Transactions |
| Year of publication | 2002 |
| Journal issue | 12 |
| Pages of publication | 2532 |
| a | 12.45 ± 0.002 Å |
| b | 23.723 ± 0.005 Å |
| c | 17.271 ± 0.002 Å |
| α | 90° |
| β | 102.4 ± 0.01° |
| γ | 90° |
| Cell volume | 4982 ± 1.5 Å3 |
| Cell temperature | 218 ± 2 K |
| Ambient diffraction temperature | 218 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0426 |
| Residual factor for significantly intense reflections | 0.0313 |
| Weighted residual factors for all reflections | 0.0791 |
| Weighted residual factors for significantly intense reflections | 0.0663 |
| Goodness-of-fit parameter for all reflections | 1.071 |
| Goodness-of-fit parameter for significantly intense reflections | 1.1 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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