Information card for entry 7011956

Structure parameters

• Common name: [{(Me2NSiMe2)(Me3Si)2CCuCNLi(thf)2}2]
• Formula: C40 H92 Cu2 Li2 N4 O4 Si6
• Calculated formula: C40 H92 Cu2 Li2 N4 O4 Si6
• SMILES: [Cu](C#[N]1[Li]([O]2CCCC2)([O]2CCCC2)[N](#C[Cu]C([Si](N(C)C)(C)C)([Si](C)(C)C)[Si](C)(C)C)[Li]1([O]1CCCC1)[O]1CCCC1)C([Si](N(C)C)(C)C)([Si](C)(C)C)[Si](C)(C)C
• Title of publication: Syntheses and structures of lithium cyanocuprates containing the C(SiMe3)3, C(SiMe3)2(SiMe2NMe2) and C(SiMe3)(SiMe2OMe)2 groups
• Authors of publication: Eaborn, Colin; El-Hamruni, Salima M.; Hill, Michael S.; Hitchcock, Peter B.; David Smith, J.
• Journal of publication: Journal of the Chemical Society, Dalton Transactions
• Year of publication: 2002
• Journal issue: 21
• Pages of publication: 3975
• a: 13.344 ± 0.006 Å
• b: 13.797 ± 0.012 Å
• c: 16.934 ± 0.012 Å
• α: 103.59 ± 0.07°
• β: 94.01 ± 0.05°
• γ: 106.63 ± 0.06°
• Cell volume: 2872 ± 4 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 7
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.1007
• Residual factor for significantly intense reflections: 0.0665
• Weighted residual factors for significantly intense reflections: 0.1657
• Weighted residual factors for all reflections included in the refinement: 0.1908
• Goodness-of-fit parameter for all reflections included in the refinement: 0.982
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No