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Information card for entry 7014058
Preview
| Coordinates | 7014058.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C60 H50 O4.43 P Si2 V |
|---|---|
| Calculated formula | C60 H50 O4.4291 P Si2 V |
| Title of publication | Mixed crystals containing the dioxo complex [[Ph3SiO]2VO2]- and novel pentacoordinated oxoperoxo complex [[Ph3SiO]2VO(O2)]-: X-ray crystal structure and assessment as oxidation catalysts. |
| Authors of publication | Vennat, Maxence; Bregeault, Jean-Marie; Herson, Patrick |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2004 |
| Journal issue | 6 |
| Pages of publication | 908 - 913 |
| a | 22.362 ± 0.008 Å |
| b | 11.27 ± 0.006 Å |
| c | 23.069 ± 0.006 Å |
| α | 90° |
| β | 119 ± 0.02° |
| γ | 90° |
| Cell volume | 5085 ± 4 Å3 |
| Cell temperature | 295 K |
| Ambient diffraction temperature | 295 K |
| Ambient diffracton pressure | 1 kPa |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0941 |
| Residual factor for significantly intense reflections | 0.0512 |
| Weighted residual factors for all reflections | 0.0657 |
| Weighted residual factors for significantly intense reflections | 0.0636 |
| Weighted residual factors for all reflections included in the refinement | 0.0636 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.015 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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