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Information card for entry 7014335
Preview
Coordinates | 7014335.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C32 H62 Dy N O12 Si6 |
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Calculated formula | C32 H62 Dy N O12 Si6 |
SMILES | [Dy]123([O]=C(O[Si](C)(C)C)C=C(O1)O[Si](C)(C)C)([O]=C(O[Si](C)(C)C)C=C(O[Si](C)(C)C)O3)(OC(=CC(O[Si](C)(C)C)=[O]2)O[Si](C)(C)C)[n]1ccccc1 |
Title of publication | Malonate complexes of dysprosium: synthesis, characterization and application for LI-MOCVD of dysprosium containing thin films. |
Authors of publication | Milanov, Andrian P.; Seidel, Rüdiger W; Barreca, Davide; Gasparotto, Alberto; Winter, Manuela; Feydt, Jürgen; Irsen, Stephan; Becker, Hans-Werner; Devi, Anjana |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2011 |
Journal volume | 40 |
Journal issue | 1 |
Pages of publication | 62 - 78 |
a | 21.8588 ± 0.0006 Å |
b | 21.5855 ± 0.0007 Å |
c | 22.2231 ± 0.0008 Å |
α | 90° |
β | 109.218 ± 0.003° |
γ | 90° |
Cell volume | 9901.3 ± 0.6 Å3 |
Cell temperature | 113 ± 2 K |
Ambient diffraction temperature | 113 ± 2 K |
Number of distinct elements | 6 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0454 |
Residual factor for significantly intense reflections | 0.028 |
Weighted residual factors for significantly intense reflections | 0.0597 |
Weighted residual factors for all reflections included in the refinement | 0.0674 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.172 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7014335.html
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