Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7014495
Preview
| Coordinates | 7014495.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C40 H30 Ag2 F12 N6 P2 |
|---|---|
| Calculated formula | C40 H30 Ag2 F12 N6 P2 |
| SMILES | c1ccc2=C(c3ccc[nH]3)c3ccc(cc3)c3cc[n]([Ag][n]4cccc4=C(c4ccc[nH]4)c4ccc(cc4)c4cc[n]([Ag][n]12)cc4)cc3.[P](F)(F)(F)(F)(F)[F-].[P](F)(F)(F)(F)(F)[F-] |
| Title of publication | Dipyrrin based silver [2 + 2] metallamacrocycles. |
| Authors of publication | Pogozhev, Dmitry; Baudron, Stéphane A; Hosseini, Mir Wais |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2011 |
| Journal volume | 40 |
| Journal issue | 2 |
| Pages of publication | 437 - 445 |
| a | 10.3668 ± 0.0003 Å |
| b | 13.6996 ± 0.0004 Å |
| c | 13.8058 ± 0.0004 Å |
| α | 90° |
| β | 95.626 ± 0.001° |
| γ | 90° |
| Cell volume | 1951.27 ± 0.1 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0531 |
| Residual factor for significantly intense reflections | 0.0405 |
| Weighted residual factors for significantly intense reflections | 0.1057 |
| Weighted residual factors for all reflections included in the refinement | 0.1137 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.034 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7014495.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.