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Information card for entry 7015364
Preview
Coordinates | 7015364.cif |
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Original paper (by DOI) | HTML |
Formula | C4 H76 Hf4 K12 O116 Si2 W20 |
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Calculated formula | C4 H6 Hf4 K12 O116 Si2 W20 |
Title of publication | Alpha and beta isomers of tetrahafnium(IV) containing decatungstosilicates, [Hf4(OH)6(CH3COO)2(x-SiW10O37)2]12- (x = α, β). |
Authors of publication | Assran, Awatef S.; Mal, Sib Sankar; Izarova, Natalya V.; Banerjee, Abhishek; Suchopar, Andreas; Sadakane, Masahiro; Kortz, Ulrich |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2011 |
Journal volume | 40 |
Journal issue | 12 |
Pages of publication | 2920 - 2925 |
a | 11.9568 ± 0.0007 Å |
b | 14.0724 ± 0.0009 Å |
c | 16.9434 ± 0.0013 Å |
α | 87.005 ± 0.004° |
β | 81.778 ± 0.004° |
γ | 80.056 ± 0.004° |
Cell volume | 2778.1 ± 0.3 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.108 |
Residual factor for significantly intense reflections | 0.0582 |
Weighted residual factors for significantly intense reflections | 0.1388 |
Weighted residual factors for all reflections included in the refinement | 0.1663 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.015 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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