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Information card for entry 7016036
Preview
Coordinates | 7016036.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C32 H25 F2 N7 O4 Ru S2 |
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Calculated formula | C32 H25 F2 N7 O4 Ru S2 |
SMILES | [Ru]12(N=C=S)(N=C=S)([n]3ccc(cc3N3C=2N(C=C3)Cc2cc(cc(c2)F)F)C)[n]2ccc(cc2c2[n]1ccc(c2)C(=O)OC)C(=O)OC |
Title of publication | Carbene-based ruthenium photosensitizers. |
Authors of publication | Chen, Huei-Siou; Chang, Wei-Chun; Su, Chaochin; Li, Ting-Yu; Hsu, Nai-Mu; Tingare, Yogesh S.; Li, Chung-Yen; Shie, Jun-Han; Li, Wen-Ren |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2011 |
Journal volume | 40 |
Journal issue | 25 |
Pages of publication | 6765 - 6770 |
a | 15.827 ± 0.002 Å |
b | 17.404 ± 0.003 Å |
c | 15.344 ± 0.002 Å |
α | 90° |
β | 109.473 ± 0.003° |
γ | 90° |
Cell volume | 3984.8 ± 1 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 7 |
Space group number | 9 |
Hermann-Mauguin space group symbol | C 1 c 1 |
Hall space group symbol | C -2yc |
Residual factor for all reflections | 0.0535 |
Residual factor for significantly intense reflections | 0.0402 |
Weighted residual factors for significantly intense reflections | 0.082 |
Weighted residual factors for all reflections included in the refinement | 0.0861 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.995 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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